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[1]王英,张超,迟媛媛,等.锆钛酸铅95/5薄膜的介电性能与弛豫特征[J].武汉工程大学学报,2012,(3):42-44.
　WANG Ying,ZHANG Chao,CHI Yuan\|yuan,et al.Dielectric properties and relaxation characterization for PZT95/5 films[J].Journal of Wuhan Institute of Technology,2012,(3):42-44.
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锆钛酸铅95/5薄膜的介电性能与弛豫特征(/HTML)
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《武汉工程大学学报》[ISSN:1674-2869/CN:42-1779/TQ]

卷:
期数:
2012年3期
页码:
42-44
栏目:
机电与信息工程
出版日期:
2012-03-31

文章信息/Info

Title:
Dielectric properties and relaxation characterization for PZT95/5 films
文章编号:
16742869(2012)03004203
作者:
王英; 张超; 迟媛媛; 余大书*
天津师范大学物理与电子信息学院，天津 300387
Author(s):
WANG Ying;  ZHANG Chao;  CHI Yuan\|yuan;  YU Da\|shu
College of Physics and Electronic Information Science, Tianjin Normal University, Tianjin 300387，China
关键词:
溶胶-凝胶; 反铁电-铁电相变; 介电谱; 普适弛豫定律
Keywords:
Sol\|Gel;  AFE\|FE phase transition;  dielectric spectrum;  universal relaxation laws
分类号:
TB332
DOI:
-
文献标志码:
AAdoi:103969/jissn16742869201203001
摘要:
采用溶胶-凝胶法制备锆钛酸铅95/5（PZT95/5）薄膜，通过分析介电温度谱、介电频谱研究薄膜的介电性能.研究结果表明：介电常数\|温度曲线ε(T)的相变峰随着频率的增加而逐渐变得平坦.同时，介电常数倒数与温度曲线ε-1(T)在高频不符合居里外斯定律；采用普适弛豫定律公式，对不同温度下的介电频谱曲线ε(f)进行拟合，得到弥散系数随着温度的变化曲线，该曲线在铁电\|顺电转变以及反铁电\|铁电转变这两个特征温度附近出现异常，结合材料反铁电\|铁电\|顺电相变的微观结构变化规律对此现象进行了讨论.
Abstract:
The dielectric properties on PZT95/5 films by Sol\|Gel process was studied by means of dielectric spectrums for temperature and frequency, respectively. The results showed that the transition peak of ε(T) curve got  broad and flat with increasing frequency and the ε-1(T) curve at high frequency didn’t obey the Curie\|Weiss law. The ε-1(f)curves with different temperatures were fitted by the universal relaxation law, and the exponent n(T) curve was obtained. In this curve, there were abnormal points near the two characteristic temperatures of FE\|PE and AFE\|FE transition,which was discussed combining the change in microstucture with the AFE\|FE\|FE transition process.

参考文献/References:

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